DocumentCode :
3829262
Title :
Landmarks in R&M Engineering: 18 On Doing Good
Issue :
4
fYear :
1982
Firstpage :
323
Lastpage :
323
Keywords :
"Integrated circuit yield","Postal services","Consumer electronics","Gold","Silver","Steel","Marketing and sales","Integrated circuit reliability","History","Production"
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1982.5221365
Filename :
5221365
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3829262