DocumentCode :
3829298
Title :
Landmarks in R&M Engineering: 20 On Miniaturization
Issue :
1
fYear :
1983
Firstpage :
78
Lastpage :
78
Keywords :
"Testing","Delay","Consumer electronics","Control systems","Data security","Stock markets","Remuneration","Insurance","Very large scale integration","Games"
Journal_Title :
IEEE Transactions on Reliability
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1983.5221479
Filename :
5221479
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3829298