DocumentCode :
383063
Title :
On-line disturbance recognition utilizing vector quantization based fast match
Author :
Abdel-Galil, T.K. ; El-Saadany, E.F. ; Youssef, A.M. ; Salama, M.M.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume :
2
fYear :
2002
fDate :
25-25 July 2002
Firstpage :
1027
Abstract :
In this paper, a given power quality event is matched against a set of known power quality events in a database. Matlab was utilized in constructing this database by simulating different power quality phenomena. Feature vectors are extracted from windowed Fourier transform or windowed Walsh transform. These features are further processed by vector quantization for minimizing the calculation burden. A fast match (FM) algorithm is proposed to find the degree of similarity between the labels of tested phenomena and the pre-stored labels for different power quality phenomena. In this paper we study the effect of changing the codebook size, and type of feature extraction used on the classification accuracy of the proposed classifier. Results show that the implementation of such a classifier is simple, yet it results in high classification rate, which makes it a very competitive alternative for already existing classifiers, which suffer from large computation burden and complicated structure.
Keywords :
Fourier transforms; Walsh functions; feature extraction; power supply quality; power system analysis computing; power system faults; vector quantisation; Matlab; classification accuracy; codebook size change; database; fast match algorithm; feature extraction; feature vectors extraction; on-line disturbance recognition; power quality; vector quantization based fast match; windowed Fourier transform; windowed Walsh transform; Artificial neural networks; Feature extraction; Fourier transforms; Frequency; Fuzzy logic; Neural networks; Power quality; Spatial databases; Vector quantization; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7518-1
Type :
conf
DOI :
10.1109/PESS.2002.1043561
Filename :
1043561
Link To Document :
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