• DocumentCode
    383253
  • Title

    Recognition of cotton contaminants via X-ray microtomographic image analysis

  • Author

    Pai, Ajay ; Sari-Sarraf, Hamed ; Hequet, Eric F.

  • Author_Institution
    Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    13-18 Oct. 2002
  • Firstpage
    312
  • Abstract
    Technologies currently used for cotton contaminant assessment suffer from some fundamental limitations. These limitations result in the misassessment of the cotton quality, and have a serious impact on its economic value. Through their research, the authors have shown that X-ray microtomographic image analysis may be applied with a high degree of success to noninvasive evaluation of cotton for the recognition of contaminants. They believe that this procedure, when realized in real time, will have a serious impact on the cotton cleaning process, and indeed on the economic value of cotton.
  • Keywords
    X-ray microscopy; image classification; image recognition; textile industry; tomography; X-ray microtomographic image analysis; X-ray tomography; cotton contaminants recognition; economic value; pattern classification; Conducting materials; Cotton; Image analysis; Image color analysis; Image recognition; Pollution measurement; Surface contamination; Tomography; X-ray detectors; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
  • Conference_Location
    Pittsburgh, PA, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-7420-7
  • Type

    conf

  • DOI
    10.1109/IAS.2002.1044106
  • Filename
    1044106