DocumentCode :
383253
Title :
Recognition of cotton contaminants via X-ray microtomographic image analysis
Author :
Pai, Ajay ; Sari-Sarraf, Hamed ; Hequet, Eric F.
Author_Institution :
Texas Tech. Univ., Lubbock, TX, USA
Volume :
1
fYear :
2002
fDate :
13-18 Oct. 2002
Firstpage :
312
Abstract :
Technologies currently used for cotton contaminant assessment suffer from some fundamental limitations. These limitations result in the misassessment of the cotton quality, and have a serious impact on its economic value. Through their research, the authors have shown that X-ray microtomographic image analysis may be applied with a high degree of success to noninvasive evaluation of cotton for the recognition of contaminants. They believe that this procedure, when realized in real time, will have a serious impact on the cotton cleaning process, and indeed on the economic value of cotton.
Keywords :
X-ray microscopy; image classification; image recognition; textile industry; tomography; X-ray microtomographic image analysis; X-ray tomography; cotton contaminants recognition; economic value; pattern classification; Conducting materials; Cotton; Image analysis; Image color analysis; Image recognition; Pollution measurement; Surface contamination; Tomography; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location :
Pittsburgh, PA, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7420-7
Type :
conf
DOI :
10.1109/IAS.2002.1044106
Filename :
1044106
Link To Document :
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