• DocumentCode
    383316
  • Title

    Artificial intelligence based measurement system supervision

  • Author

    Durakbasa, M.N.

  • Author_Institution
    Dept. for Interchangeable Manuf. & Ind. Metrol., Vienna Univ. of Technol., Wien, Austria
  • Volume
    1
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    298
  • Abstract
    The permanent increasing of quality standards, world wide competition, as well as the legislation of regulation of the product responsibility, require not only a proper documentation of the measurement data of the production, but also the continuous supervision of measuring and test equipment. Especially in modern flexible and intelligent production environment, measuring devices are often connected directly with the manufacturing process. This causes direct or indirect influences on the quality level, therefore the supervision and management of measuring and test equipment is becoming a significant part of the quality management for the entire production. The supervision of measuring equipment is an essential quality requirement for modern production especially at the higher demands of micro and nano technology. The efficiency of the confirmation can be increased and expenses can be reduced substantially through computer assistance with flexible checking intervals. A special method developed for this purpose allows to increase of the flexibility level and efficiency of a system for the intelligent management and supervision of measuring devices.
  • Keywords
    artificial intelligence; computerised instrumentation; fuzzy logic; artificial intelligence based measurement system supervision; documentation; flexible checking intervals; flexible production environment; fuzzy logic dynamification; intelligent management; intelligent production environment; intelligent supervision; micro technology; nano technology; product responsibility; quality standards; Artificial intelligence; Documentation; Fuzzy logic; Intelligent systems; Measurement standards; Monitoring; Production systems; Quality management; Test equipment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems, 2002. Proceedings. 2002 First International IEEE Symposium
  • Print_ISBN
    0-7803-7134-8
  • Type

    conf

  • DOI
    10.1109/IS.2002.1044271
  • Filename
    1044271