DocumentCode
383330
Title
300 mm ultra thin SOI material using Smart-Cut® technology
Author
Auberton-Hervé, A.J. ; Maleville, C.
Author_Institution
SOITEC SA, Crolles, France
fYear
2002
fDate
7-10 Oct 2002
Firstpage
1
Lastpage
5
Abstract
We discuss a new ultra thin 300 mm SOI material, Unibond(R), which fulfills industry requirements in terms of uniformity, quality and availability.
Keywords
ion implantation; oxidation; polishing; semiconductor technology; silicon-on-insulator; 300 mm; low energy implantation; oxidation; polishing; quality; smart-cut technology; ultra thin SOI material; uniformity; Ion implantation; Oxidation; Semiconductor device fabrication; Silicon on insulator technology; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, IEEE International 2002
Print_ISBN
0-7803-7439-8
Type
conf
DOI
10.1109/SOI.2002.1044396
Filename
1044396
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