Title :
Reflection of electromagnetic waves from rough waveguides
Author :
R. Garcia-Molina;J. Ruiz;R. Chicoon;M. Ortuno;J.M.F. Gunn
Author_Institution :
Dept. de Fisica, Murcia Univ., Spain
Abstract :
The reflection coefficient of a section of randomly rough waveguide is calculated using a coordinate transformation developed by A.K. Mallick and G.S. Sanyal (ibid., vol.26, no.4, p.243-9, 1978). A perturbed analysis which assumes that the amplitude of the roughness is small compared to the average width of the waveguide is performed. A drastic difference at long wavelengths between TEM on the one hand and TE and TM on the other has been found.
Keywords :
"Electromagnetic waveguides","Electromagnetic reflection","Electromagnetic scattering","Frequency","Rough surfaces","Surface roughness","Microstrip","Stripline","Surface waves","Magnetic resonance"
Journal_Title :
IEEE Transactions on Microwave Theory and Techniques
