• DocumentCode
    3834749
  • Title

    Book review: The Technological Trap

  • Author

    Ieuan Maddock

  • Volume
    56
  • Issue
    3
  • fYear
    1986
  • fDate
    3/1/1986 12:00:00 AM
  • Firstpage
    93
  • Journal_Title
    Journal of the Institution of Electronic and Radio Engineers
  • Publisher
    iet
  • ISSN
    0267-1689
  • Type

    jour

  • DOI
    10.1049/jiere.1986.0030
  • Filename
    5261422