Title :
Statistical analysis of the resolution in a current-mode ADC
Author :
Giustolisi, Gianluca ; Palumbo, Gaetano ; Pennisi, Salvatore
Author_Institution :
DEES, Catania Univ., Italy
Abstract :
Theoretical analysis of the resolution of a current-mode algorithmic analog-to-digital converter is presented in this paper. The non-ideal effects of current mirrors due to process tolerances have been taken into account. To support the analysis, a 4-bit ADC was realized in a 0.35-μm CMOS technology. Simulation results were found to be in excellent agreement with theoretical derivations.
Keywords :
CMOS integrated circuits; analogue-digital conversion; current mirrors; current-mode circuits; statistical analysis; 0.35 micron; 4 bit; ADC resolution; CMOS technology; algorithmic ADC; analog-to-digital converter; current mirrors; current-mode ADC; nonideal effects; process tolerances; statistical analysis; Algorithm design and analysis; Analog-digital conversion; Artificial intelligence; CMOS technology; Inverters; Mirrors; Quantization; SPICE; Statistical analysis; Voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1045319
