DocumentCode :
3835894
Title :
Metallurgic and contact resistance studies of sleeve connectors in aluminum cable splices
Author :
C. Dang;M. Braunovic
Author_Institution :
Inst. de Recherche d´Hydro-Quebec, Varennes, Que., Canada
Volume :
13
Issue :
1
fYear :
1990
Firstpage :
74
Lastpage :
80
Abstract :
Two types of sleeve connector used in aluminum cable splices were examined after being tested in a series of accelerated aging experiments. The connectors differed in working principle as well as design. Diagnostic techniques such as optical microscopy, scanning electron microscopy, and energy dispersive X-ray analysis were applied to reveal the microstructure of the contact. The observations correlate well with measurements of the contact resistance. Corrective measures are suggested to improve the performance of the cable splices.
Keywords :
"Contact resistance","Connectors","Optical microscopy","Scanning electron microscopy","Electrical resistance measurement","Aluminum","Testing","Accelerated aging","Electron optics","Dispersion"
Journal_Title :
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.52852
Filename :
52852
Link To Document :
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