Analysis of bandpass sigma-delta modulator architectures

Author

Hidalgo, J. J Ocampo ; Ortiz, A. Garcia ; Kabulepa, L.D. ; Glesner, M.

Author_Institution

Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany

Volume

1

fYear

2002

fDate

2002

Firstpage

311

Abstract

This work analyses two architectures of bandpass sigma delta modulators, in order to find their sensitivity against operational amplifier finite voltage gain, having in mind a switched capacitor realization of both architectures. Expressions for the ideal signal to noise ratio and dynamic range of both architectures are found, as well as a model of the degradation of the mentioned parameters due to finite values of the voltage gain. The proposed model is then compared with nonlinear high level simulations including the effect of finite voltage gain.

Keywords

circuit noise; linear network analysis; modulators; operational amplifiers; sensitivity analysis; sigma-delta modulation; switched capacitor networks; SC realization; bandpass sigma-delta modulator architectures; ideal SNR; ideal dynamic range; ideal signal/noise ratio; linearized analysis; operational amplifier finite voltage gain; sensitivity; switched capacitor realization; CMOS technology; Capacitors; Data conversion; Delta modulation; Delta-sigma modulation; Dynamic range; Operational amplifiers; Receivers; Signal to noise ratio; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2002. 9th International Conference on

Print_ISBN

0-7803-7596-3

Type

conf

DOI

10.1109/ICECS.2002.1045396

Filename

1045396