A method to design MMICs for high production yields

In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification of the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As an example, this technique has been applied to design a MMIC to be employed on equipment where a high number of devices is required.