Title :
A robust semi-supervised EM-based clustering algorithm with a reject option
Author :
Saint-Jean, Christophe ; Freicot, C.
Author_Institution :
UPRES, La Rochelle, France
Abstract :
In this paper we address the problem of semi-supervision in the framework of parametric clustering by using labeled and unlabeled data together Clustering algorithms can take advantage from few labeled instances in order to tune parameters, improve convergence and overcome local extrema due to bad initialization. We extend a robust parametric clustering algorithm able to manage outlier rejection to the semi-supervision approach. This is achieved by modifying the expectation-maximization algorithm. The proposed method shows good performance with respect to data structure discovering, even facing to outliers.
Keywords :
data structures; maximum likelihood estimation; pattern clustering; bad initialization; convergence; data structure discovery; expectation-maximization algorithm; labeled data; local extrema; outlier rejection; parametric clustering; robust parametric clustering algorithm; robust semi-supervised EM-based clustering algorithm; semi-supervision; unlabeled data; Clustering algorithms; Clustering methods; Convergence; Data structures; Pattern recognition; Probability density function; Prototypes; Robustness; Support vector machines; Unsupervised learning;
Conference_Titel :
Pattern Recognition, 2002. Proceedings. 16th International Conference on
Print_ISBN :
0-7695-1695-X
DOI :
10.1109/ICPR.2002.1047930