• DocumentCode
    38435
  • Title

    A 1 Tbit/s Bandwidth 1024 b PLL/DLL-Less eDRAM PHY Using 0.3 V 0.105 mW/Gbps Low-Swing IO for CoWoS Application

  • Author

    Mu-Shan Lin ; Chien-Chun Tsai ; Chih-Hsien Chang ; Wen-Hung Huang ; Ying-Yu Hsu ; Shu-Chun Yang ; Chin-Ming Fu ; Mao-Hsuan Chou ; Tien-Chien Huang ; Ching-Fang Chen ; Tze-Chiang Huang ; Adham, Saman ; Min-Jer Wang ; Shen, William Wu ; Mehta, A.

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
  • Volume
    49
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    1063
  • Lastpage
    1074
  • Abstract
    A 1 Tbit/s bandwidth PHY is demonstrated through CoWoS™ platform. Two chips: SOC and embedded DRAM (eDRAM), have been fabricated in TSMC 40 nm CMOS technology and stacked on a silicon interposer chip. 1024 DQ buses operating at 1.1 Gbit/s with VDDQ = 0.3 V are proven between SOC chip and eDRAM chip in experimental results with 1 mm signal trace length on the silicon interposer. A novel timing compensation mechanism is presented to achieve a low-power and small area eDRAM PHY that excludes PLL/DLL but retains good timing margin. Another data sampling alignment training approach is employed to enhance timing robustness. A compact low-swing IO also achieves power efficiency of 0.105 mW/Gbps.
  • Keywords
    CMOS memory circuits; DRAM chips; compensation; elemental semiconductors; silicon; system-on-chip; timing; CoWoS Application; DQ buses; PLL/DLL-Less eDRAM PHY; SOC; Si; TSMC CMOS; bit rate 1.1 Gbit/s; data sampling alignment training approach; embedded DRAM; low-swing IO; power efficiency; signal trace length; silicon interposer chip; size 40 nm; timing compensation mechanism; timing robustness; voltage 0.3 V; Bandwidth; Clocks; Phase locked loops; Receivers; System-on-chip; Timing; Topology; 2.5D-IC; Chip on wafer on substrate; CoWoS; DLL; PHY; PLL; SII; eDRAM; low-swing IO; micro-bump; silicon-interposer; timing compensation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2297399
  • Filename
    6774479