DocumentCode :
384388
Title :
Robust contrast-invariant eigen detection
Author :
Chennubhotla, Chakra ; Jepson, Allan ; Midgley, John
Author_Institution :
Dept. of Comput. Sci., Toronto Univ., Ont., Canada
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
745
Abstract :
We achieve two goals in this paper: (1) to build a novel appearance-based object representation that takes into account variations in contrast often found in training images; (2) to develop a robust appearance-based detection scheme that can handle outliers such as occlusion and structured noise. To build the representation, we decompose the input ensemble into two subspaces: a principal subspace (within-subspace) and its orthogonal complement (out-of-subspace). Before computing the principal subspace, we remove any dependency on contrast that the training set might exhibit. To account for pixel outliers in test images, we model the residual signal in the out-of-subspace by a probabilistic mixture model of an inlier distribution and a uniform outlier distribution. The mixture model, in turn, facilitates the robust estimation of the within-subspace coefficients. We show our methodology leads to an effective classifier for separating images of eyes from non-eyes extracted from the FERET dataset.
Keywords :
Gaussian distribution; estimation theory; image coding; image representation; object detection; principal component analysis; FERET dataset; appearance-based object representation; eye database; inlier distribution; occlusion; orthogonal complement; out-of-subspace; outliers; pixel outliers; principal component analysis; principal subspace; probabilistic mixture model; residual signal modeling; robust appearance-based detection scheme; robust contrast-invariant eigen detection; robust estimation; structured noise; training images; uniform outlier distribution; unit-variance Gaussian distribution; within-subspace coefficients; Computer science; Educational institutions; Eyes; Image coding; Image databases; Image reconstruction; Pixel; Principal component analysis; Robustness; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2002. Proceedings. 16th International Conference on
ISSN :
1051-4651
Print_ISBN :
0-7695-1695-X
Type :
conf
DOI :
10.1109/ICPR.2002.1048410
Filename :
1048410
Link To Document :
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