Title :
Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators
Author :
Gorur, R.S. ; Sivasubramaniyam, S.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
Insulators can develop different types of defects during manufacturing, mishandling and when exposed to various atmospheric conditions while in service. The type of defects commonly obtained range from voids, improper adhesion, and cracks. Timely detection of these defects is essential to avoid power supply disruption due to insulator failure. This paper presents a study to determine if defects cause significant change in the electric field along or near the insulator surface. An attempt is needed to determine defects that do and do not cause a change in electric field.
Keywords :
ceramic insulators; insulator testing; ceramic insulator; defect detection; electric field; nonceramic insulator; outdoor high voltage insulator; Adhesives; Ceramics; Computer aided manufacturing; Conductivity; Dielectrics and electrical insulation; Glass; Power supplies; Probes; Surface cracks; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
DOI :
10.1109/CEIDP.2002.1048799