DocumentCode :
384531
Title :
Computation of defect-induced electric fields on outdoor high voltage ceramic and non-ceramic insulators
Author :
Gorur, R.S. ; Sivasubramaniyam, S.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2002
fDate :
2002
Firstpage :
319
Lastpage :
322
Abstract :
Insulators can develop different types of defects during manufacturing, mishandling and when exposed to various atmospheric conditions while in service. The type of defects commonly obtained range from voids, improper adhesion, and cracks. Timely detection of these defects is essential to avoid power supply disruption due to insulator failure. This paper presents a study to determine if defects cause significant change in the electric field along or near the insulator surface. An attempt is needed to determine defects that do and do not cause a change in electric field.
Keywords :
ceramic insulators; insulator testing; ceramic insulator; defect detection; electric field; nonceramic insulator; outdoor high voltage insulator; Adhesives; Ceramics; Computer aided manufacturing; Conductivity; Dielectrics and electrical insulation; Glass; Power supplies; Probes; Surface cracks; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
Type :
conf
DOI :
10.1109/CEIDP.2002.1048799
Filename :
1048799
Link To Document :
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