3846256

SSCS and the IEEE Technology Management Council [Socnews]

Rakesh Kumar

2

1

2010

75

75

"Technology Management Council","Technology management","Micromechanical devices","Electronic equipment testing","Circuit testing","Random access memory","Very large scale integration","Design automation","Automatic testing","Medical tests"

IEEE Solid-State Circuits Magazine

ieee

1943-0582

jour

10.1109/MSSC.2009.935489

5406342