Abstract :
Correlating the statistics of process parameters with the statistics of electrical performance is a vital task in statistical modeling. This article describes a more general form of the backward propagation of variance (BPV) method, a numerical technique for iteratively solving the statistics of process parameters from the statistics of electrical performance within the behavior of models encapsulated in Spice.
Keywords :
"Solid modeling","Predictive models","SPICE","Statistics","Circuit simulation","Semiconductor device modeling","CMOS technology","Principal component analysis","Analysis of variance","Numerical models"
