DocumentCode :
3846872
Title :
Introduction [Measurements Corner]
Author :
Brian E. Fischer;Ivan J. LaHaie
Author_Institution :
Integrity Appllcations Inc., 900 Victors Way, Suite 220, Ann Arbor, MI 48108 USA
Volume :
52
Issue :
1
fYear :
2010
Firstpage :
174
Lastpage :
174
Keywords :
"Pollution measurement","Antennas and propagation","Antenna measurements","Isolation technology","Antenna radiation patterns","Contamination","Area measurement","Particle measurements","Paper technology","Satellites"
Journal_Title :
IEEE Antennas and Propagation Magazine
Publisher :
ieee
ISSN :
1045-9243
Type :
jour
DOI :
10.1109/MAP.2010.5466421
Filename :
5466421
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3846872
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