• DocumentCode
    38473
  • Title

    Foreword Special Issue on Transistors With Steep Subthreshold Swing for Low-Power Electronics

  • Author

    Esseni, David ; Ionescu, Adrian M. ; Seabaugh, Alan ; Yeo, Yee-Chia

  • Author_Institution
    , University of Udine, Udine, Italy
  • Volume
    3
  • Issue
    3
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    86
  • Lastpage
    87
  • Abstract
    The increasing power consumption of integrated circuits is today the main impediment to the density scaling of integrated circuit technology. The reduction of supply voltage is the most effective way to reduce power; however, using modern transistors voltage reduction is traded against reduced speed or limited by a rising off-state leakage, neither of which is desirable. A better tradeoff can be achieved if the fundamental current control mechanism provides a steep turn-on characteristic. Steep means better than 60 mV/decade at room temperature, the limit obtained by barrier lowering in a bipolar transistor or metal oxide semiconductor field effect transistor (MOSFET) when the current is dominated by the thermionic emission of carriers above the energy barrier in the base or channel region.
  • Keywords
    Awards activities; Biological system modeling; IEEE Electron Devices Society; Integrated circuit modeling; MOSFET; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2015.2418911
  • Filename
    7091988