DocumentCode
38473
Title
Foreword Special Issue on Transistors With Steep Subthreshold Swing for Low-Power Electronics
Author
Esseni, David ; Ionescu, Adrian M. ; Seabaugh, Alan ; Yeo, Yee-Chia
Author_Institution
, University of Udine, Udine, Italy
Volume
3
Issue
3
fYear
2015
fDate
May-15
Firstpage
86
Lastpage
87
Abstract
The increasing power consumption of integrated circuits is today the main impediment to the density scaling of integrated circuit technology. The reduction of supply voltage is the most effective way to reduce power; however, using modern transistors voltage reduction is traded against reduced speed or limited by a rising off-state leakage, neither of which is desirable. A better tradeoff can be achieved if the fundamental current control mechanism provides a steep turn-on characteristic. Steep means better than 60 mV/decade at room temperature, the limit obtained by barrier lowering in a bipolar transistor or metal oxide semiconductor field effect transistor (MOSFET) when the current is dominated by the thermionic emission of carriers above the energy barrier in the base or channel region.
Keywords
Awards activities; Biological system modeling; IEEE Electron Devices Society; Integrated circuit modeling; MOSFET; Silicon;
fLanguage
English
Journal_Title
Electron Devices Society, IEEE Journal of the
Publisher
ieee
ISSN
2168-6734
Type
jour
DOI
10.1109/JEDS.2015.2418911
Filename
7091988
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