• DocumentCode
    3848575
  • Title

    Fabrication of V-grooved inner stripe GaAs-AlGaAs quantum-wire lasers

  • Author

    Tae Geun Kim; Sung-Min Hwang; Eun Kyu Kim; Suk-Ki Min; Jong-Il Jeon; Si-Jong Leem; Jichai Jeong; Jung-Ho Park

  • Author_Institution
    Semicond. Mater. Res. Center, Korea Inst. of Sci. & Technol., Seoul, South Korea
  • Volume
    9
  • Issue
    3
  • fYear
    1997
  • Firstpage
    274
  • Lastpage
    276
  • Abstract
    V-grooved inner stripe (VIS) GaAs-AlGaAs quantum-wire (QWR) lasers were successfully fabricated by, combining two-step metalorganic chemical vapor deposition (MOCVD) growth with a wet-etching technique. In order to achieve low threshold current density and high reliability, a conductive stripe width (W), a thickness (t/sub p-CBL/), and a doping concentration (n/sub p-CBL/) of the p-GaAs current-blocking layer (CBL) were determined to be W=1.2 /spl mu/m, t/sub p-CBL/=2 /spl mu/m, and n/sub p-CBL/=1/spl times/10/sup 18/ cm/sup -3/. The leakage currents passing through the CBL were also estimated using a modified P-SPICE. Thus far, a threshold current of 45 mA and an output power of 4 mW at 51 mA have been achieved under room-temperature pulsed operation for some devices with uncoated facets.
  • Keywords
    "Optical device fabrication","Chemical lasers","Pulsed laser deposition","Wet etching","Quantum well lasers","MOCVD","Threshold current","Carrier confinement","Chemical vapor deposition","Leakage current"
  • Journal_Title
    IEEE Photonics Technology Letters
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.556044
  • Filename
    556044