Title :
Highly reproducible state-of-the-art quartz oscillators
Author :
Bloch, M. ; Ho, J. ; Mancini, O.
Author_Institution :
Frequency Electron. Inc., Mitchel Field, NY, USA
Abstract :
High precision oscillators that are capable of effectively operating over large temperature ranges and extreme temperature transients are continuously sought by industry. The wireless telecommunications industry requires stable oscillators with excellent temperature coefficients to operate base stations that are located in areas of extreme temperature swings. Similarly, applications exist in the aviation, navigation, instrumentation, military, and other markets. In the past these industries had only two choices: rubidium atomic standards, or limited quantities of virtually non-reproducible precision crystal oscillators. In this paper we present a class of extremely precise and reproducible oscillators developed by Frequency Electronics, Inc. These oscillators are identified as the FE-205A Series, and are capable of providing any frequency from 1 pps to 100 MHz with typical aging of better than 5×10-11/day, and with a temperature coefficient of < 1×10-10 over the temperature range of -40°C to +75°C. Furthermore, we demonstrate that the oscillator is insensitive to fast temperature slew rates, and, consequently, the problem of overshoot and undershoot is completely eliminated. The device is being mass-produced with standard manufacturing techniques.
Keywords :
circuit stability; crystal oscillators; frequency stability; -40 to 75 degC; 100 MHz; DOCXO; FE-205A series; double oven crystal oscillator; extreme temperature transients; high precision oscillators; highly reproducible oscillators; large temperature ranges; mass-produced oscillators; quartz oscillators; reproducible oscillators; stable oscillators; standard manufacturing techniques; Base stations; Communication industry; Consumer electronics; Defense industry; Frequency; Instruments; Military communication; Navigation; Oscillators; Temperature distribution;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
DOI :
10.1109/FREQ.2002.1075955