DocumentCode :
3849804
Title :
Confidentiality of the review process
Author :
R. P. Jindal
Author_Institution :
IEEE Electron Devices Society
Volume :
10
Issue :
4
fYear :
2010
Firstpage :
415
Lastpage :
415
Journal_Title :
IEEE Transactions on Device and Materials Reliability
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2010.2083430
Filename :
5703179
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3849804