DocumentCode
384982
Title
Interpreting oscillatory frequency stability plots
Author
Howe, D.A.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
2002
fDate
2002
Firstpage
725
Lastpage
732
Abstract
Discusses the appearance of peaks and valleys in Allan deviation plots (also known as sigma-tau, root Avar, or Adev plots). This distinctly oscillatory pattern, especially at long-term τ-values, usually means the presence of quasi-sinusoidal frequency modulation of an oscillator´s signal. However, quasi-sinusoidal oscillatory behavior in sigma-tau plots at long τ may be due to statistical sampling and not to actual oscillator or clock data. Periodic variations in sigma-tau plots are often used as an indicator of periodic environmental perturbations such as a diurnal or other external influence, and it is important to know whether these variations are an analytical artifact or not. Removal of drift can make the oscillatory pattern worse. Samples of clock data for a dispersive noise process look like a portion of a sinusoid because the sample duration is less than the inverse of the data´s inherent low frequency extent. Drift removal also removes low frequency components of noise, which causes negative bias of root Avar at long tau. The root Avar and drift-removal transfer functions have peaks and s that interfere with each other and can cause an oscillatory pattern in the resulting sigma-tau plot.
Keywords
circuit stability; frequency modulation; frequency response; frequency stability; nonlinear network analysis; oscillators; Adev plots; Allan deviation plots; dispersive noise process; drift-removal transfer functions; low frequency extent; oscillator data; oscillatory frequency stability plots; oscillatory pattern; periodic environmental perturbations; quasi-sinusoidal frequency modulation; root Avar plots; sigma-tau plots; sinusoid; statistical sampling; Clocks; Dispersion; Frequency conversion; Frequency domain analysis; Frequency estimation; Low-frequency noise; NIST; Oscillators; Sampling methods; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN
0-7803-7082-1
Type
conf
DOI
10.1109/FREQ.2002.1075976
Filename
1075976
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