Title :
Gate driver for SiC JFETs with protection against normally-on behaviour induced fault
Author :
F Guédon;S K Singh;R A McMahon;F Udrea
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fDate :
3/17/2011 12:00:00 AM
Abstract :
A fast gate driver for normally-on silicon carbide (SiC) junction field-effect transistors (JFETs) is presented. It includes a protection feature against short-circuits due to the normally-on behaviour of the JFETs.
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2011.0241
