DocumentCode
3851398
Title
Encapsulation for Flexible Electronic Devices
Author
Thomas Kinkeldei;Niko Munzenrieder;Christoph Zysset;Kunigunde Cherenack;Gerhard Tr?ster
Author_Institution
Electronics Laboratory, Swiss Federal Institute of Technology Zurich, Zurich, Switzerland
Volume
32
Issue
12
fYear
2011
Firstpage
1743
Lastpage
1745
Abstract
Flexible electronic devices are influenced by mechanical impacts or bending. This mechanical stress can damage brittle inorganic thin-film layers. One way to improve the stability of such devices is to encapsulate them. For this reason, we encapsulate brittle inorganic materials in our thin-film transistors (TFTs) on flexible polyimide (Kapton) substrates by gluing a second patterned flexible polyimide substrate on top. The developed encapsulation method has the advantages of low process temperatures and micrometer alignment between features on the two substrates and does not damage any thin-film device layer. We are able to bend encapsulated TFTs down to a radius of 125 μm without loss of functionality. At this bending radius, the saturation mobility decreases by 3%, and the threshold voltage shifts by 0.2 V. Compared with nonencapsulated TFTs, we decrease the bending radius before the devices fail by an order of magnitude.
Keywords
"Substrates","Encapsulation","Thin film transistors","Threshold voltage","Performance evaluation"
Journal_Title
IEEE Electron Device Letters
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2011.2168378
Filename
6059472
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