Title :
Nonlinear conduction in platinum nanoparticle films
Author :
Mihaila, M. ; Grigoriu, C. ; Danila, M. ; Craciunoiu, F. ; Gavrila, R. ; Steriu, D. ; Stanciu, G. ; Ursutiu, D. ; Dragan, G. ; Dinoiu, I.
Author_Institution :
Nat. Inst. of Microtechnology, Bucharest, Romania
Abstract :
Platinum (deca)nanoparticles with a size between (25-150) nm have been deposited on a SiO2/Si substrate by laser ablation. Roughly estimated, the particle distribution deviates from lognormal distribution at larger particle size. Electrical measurements on nanoparticle films with different surface coverage revealed that the films start conducting at a given percolation threshold. As expected, ohmic I-V characteristics were found in all investigated structures. However, below a voltage threshold, a transition from linear to pronounced nonlinear behaviour was observed in the samples with a higher surface coverage. A tunneling mechanism between the metal islands partially embedded into the substrate is proposed as a source of nonlinearity. This indicates an interaction between the nanoparticle film and the substrate, a conjecture strongly supported by the observation of some Pt3Si lines in the X-ray diffractogram. Other possible causes of nonlinear conduction mechanisms are heuristically discussed.
Keywords :
X-ray diffraction; discontinuous metallic thin films; electrical conductivity; nanoparticles; percolation; platinum; pulsed laser deposition; statistical analysis; tunnelling; 25 to 150 nm; Pt decaparticle SiO2/Si substrate deposition; Pt nanoparticle film nonlinear conduction characteristics; Pt-SiO2-Si; Pt3Si; X-ray diffraction; X-ray diffractogram Pt3Si lines; film electrical properties; laser ablation; linear/nonlinear behaviour transition; nanoparticle film surface coverage; nanoparticle film/substrate interaction; nonlinear conduction mechanisms; nonlinearity sources; ohmic I-V characteristics; partially substrate embedded metal islands; particle lognormal distribution deviation; percolation threshold conduction; platinum nanoparticle size range; tunneling mechanisms; ultrafine metal particles; voltage threshold; Conductive films; Electric variables measurement; Laser ablation; Platinum; Rough surfaces; Semiconductor films; Substrates; Surface roughness; Threshold voltage; Tunneling;
Conference_Titel :
Semiconductor Conference, 2002. CAS 2002 Proceedings. International
Print_ISBN :
0-7803-7440-1
DOI :
10.1109/SMICND.2002.1105813