DocumentCode :
3852588
Title :
Higher Order Statistics of Sampled Fading Channels With Applications
Author :
F. J. López-Martínez;E. Martos-Naya;J. F. Paris;U. Fernández-Plazaola
Author_Institution :
Dept. Ing. de Comun., Univ. de Malaga, Malaga, Spain
Volume :
61
Issue :
7
fYear :
2012
Firstpage :
3342
Lastpage :
3346
Abstract :
In this paper, we present a novel analytical framework for the calculation of the level crossing rate (LCR) and the average fade duration (AFD) of fading channels sampled at a certain sampling period TS. These expressions are valid for arbitrary fading distributions with arbitrary correlation and can be easily computed in terms of the cumulative distribution function (cdf) of the fading envelope and its bivariate cdf. This approach yields interesting insights into the effect of finite sampling in the higher order statistics of fading processes. We also demonstrate that the proposed expressions for sampled fading process converge with the existing expressions for continuous fading processes as the sampling period tends to zero. As a direct application, exact closed-form expressions are given for the LCR and AFD of sampled Rayleigh fading processes, which are suitable to characterize the higher order statistics of the equivalent frequency-domain fading process in multipath Rayleigh fading.
Keywords :
"Random processes","Rayleigh channels","Higher order statistics","Correlation","OFDM","Frequency domain analysis"
Journal_Title :
IEEE Transactions on Vehicular Technology
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2012.2199528
Filename :
6200887
Link To Document :
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