Progression of left ventricular wall thickness during pressure-overload left ventricular hypertrophy

Author

Feng, Minjie ; Li, John K J ; Khaw, Kenneth ; Drzewiecki, Gary M.

Author_Institution

Dept. of Biomed. Eng., Rutgers Univ., Piscataway, NJ, USA

Volume

2

fYear

2002

fDate

2002

Firstpage

1222

Abstract

Pressure-overload in terms of decreased arterial compliance (C) and increased vascular resistance (Rs) was used in conjunction with a negative feedback control model to predict left ventricular (LV) wall thickness growth over a prescribed time period. The progression of left ventricular wall thickness growth was found to change proportionally with the peak systolic pressure and the extent of the combination of a reduction in C and an increase in Rs.

Keywords

cardiology; diseases; elasticity; feedback; haemodynamics; physiological models; arterial compliance; heart disease; left ventricular wall thickness progression; negative feedback control model; peak systolic pressure; pressure-overload left ventricular hypertrophy; vascular resistance; Cardiology; Delay; Ellipsoids; Hemodynamics; Immune system; Myocardium; Negative feedback; Negative feedback loops; Stress; Thickness control;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint

ISSN

1094-687X

Print_ISBN

0-7803-7612-9

Type

conf

DOI

10.1109/IEMBS.2002.1106358

Filename

1106358