Application of wavelet analysis for detection of cylindrical objects in dielectric layer using characteristic of reflection

The problem of detection and estimation of parameters of cylindrical objects in a dielectric layer using a reflection characteristic has been considered. A reflection characteristic for fixed frequency was obtained by scanning the interface of the dielectric structure with a measuring antenna probe. Use of multiscale discrete wavelet analysis has allowed one to select the peculiarities of the reflection characteristic which have been caused by the presence of objects. Thus their localization on the background of noise has been completely successful. The approximating properties of different wavelet bases for the given class of physical data using different types of measuring probes at different frequencies and for different depth of object dispositions have been explored.