Title :
The Design and Test of High-Power Waveguide Windows
Abstract :
The trend toward increased power has brought the waveguide window problem into sharp focus. Window failures have impeded the development of high-power microwave tubes. Punctures and fractures of the dielectric materials are frequently preceded by excessive heating which cannot be ascribed to dissipative losses within the body of the dielectric element. There is evidence that the temperature rise in part is due to electronic discharge on the low-pressure side of the window.
Keywords :
Contracts; Dielectric materials; Electron tubes; Research and development; Testing;
Conference_Titel :
PGMTT National Symposium Digest
Conference_Location :
Washington, DC, USA
DOI :
10.1109/PGMTT.1961.1122359