DocumentCode
385944
Title
The Design and Test of High-Power Waveguide Windows
Author
Churchill, D.B.
Volume
61
Issue
1
fYear
1961
fDate
15-17 May 1961
Firstpage
33
Lastpage
34
Abstract
The trend toward increased power has brought the waveguide window problem into sharp focus. Window failures have impeded the development of high-power microwave tubes. Punctures and fractures of the dielectric materials are frequently preceded by excessive heating which cannot be ascribed to dissipative losses within the body of the dielectric element. There is evidence that the temperature rise in part is due to electronic discharge on the low-pressure side of the window.
Keywords
Contracts; Dielectric materials; Electron tubes; Research and development; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
PGMTT National Symposium Digest
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/PGMTT.1961.1122359
Filename
1122359
Link To Document