• DocumentCode
    385971
  • Title

    A Comparison of the Performance of Millimetre-Wave Semiconductor Oscillator Devices and Circuits.

  • Author

    Smith, D.C. ; Simmons, T.J. ; Jones, M.R.B.

  • fYear
    1983
  • fDate
    May 31 1983-June 3 1983
  • Firstpage
    127
  • Lastpage
    129
  • Abstract
    A comparison of the commonly used millimetre-wave semiconductor devices is made; the Si IMPATT, GaAs TED and InP TED. The comparison is made on the basis of the primary characteristics of output power and efficiency as well as the secondary effects of amplitude and frequency stability, including a.m. and f.m. noise. A review of the waveguide circuit techniques employed with these devices is presented, emphasizing the size limitation and susceptibility to severe environmental loadings. A miniature microstrip oscillator structure employing an InP TED as the active element is described. This source has produced 32 mW at 81 GHz in microstrip and highlights the potential suitability for rugged, integrated transmitter/receiver subsystems operating at millimetre wave frequencies.
  • Keywords
    Circuit noise; Circuit stability; Frequency; Gallium arsenide; Indium phosphide; Microstrip; Oscillators; Power generation; Semiconductor devices; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1983 IEEE MTT-S International
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1983.1130832
  • Filename
    1130832