Title :
Measurement of Non-Planar Dielectric Samples Using an Open Resonator
Author :
Chan, W.F.P. ; Chambers, B.
fDate :
May 9 1975-June 11 1987
Abstract :
A new technique for the measurement of the complex permittlvity of dielectric samples having convex-concave surfaces using an open resonator is reported. The paper discusses the theory behind the new technique and describes measurements made at 11.6 GHz on perspex samples whose surfaces have radii of curvature as small as 330mm. The results obtained are in good agreement with those for the same material measured in flat sheet form.
Keywords :
Dielectric materials; Dielectric measurements; Electric variables measurement; Geometry; Mirrors; Permittivity measurement; Position measurement; Resonance; Resonant frequency; Surface waves;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132382
