DocumentCode :
386041
Title :
A Nondestructive Microwave Beam Lead Diode Measurement
Author :
White, J.F. ; Parisi, S.J.
Volume :
1
fYear :
1987
fDate :
May 9 1975-June 11 1987
Firstpage :
445
Lastpage :
448
Abstract :
Beam lead PIN diodes are commonly measured at 1 MHz or, on a sample basis destructively at microwave frequencies. This paper describes reproducible non-destructive microwave measurements using a vacuum hold down fixture.
Keywords :
Circuit testing; Conductors; Diodes; Electrical resistance measurement; Fixtures; Frequency measurement; Lead; Microwave frequencies; Microwave measurements; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1987.1132428
Filename :
1132428
Link To Document :
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