• DocumentCode
    386042
  • Title

    A Measurement and Calibration Technique for Accurate Measurement of Amplifier S Parameters

  • Author

    Roos, M. ; Sotoudeh, V.

  • Volume
    1
  • fYear
    1987
  • fDate
    May 9 1975-June 11 1987
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    With the current emphasis on active systems it is becoming more important to accurately measure amplifiers. Due to the nature of current measurement systems, and the requirements of two port error correction it is difficult to measure a device which cannot be reversed. This paper describes a means for this measurement and calibration.
  • Keywords
    Bismuth; Calibration; Current measurement; Error correction; Measurement standards; Microwave measurements; Power amplifiers; Power measurement; Reflection; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1987 IEEE MTT-S International
  • Conference_Location
    Palo Alto, CA, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1987.1132429
  • Filename
    1132429