DocumentCode
386053
Title
A New Measurement System for Oscillator Noise Characterization
Author
Riddle, A.N. ; Trew, R.J.
Volume
1
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
509
Lastpage
512
Abstract
The prediction of oscillator noise has been one of the more difficult problems in circuit analysis. A new system for measuring modulation (amplitude or phase) transfer and upconversion is presented which allows insight into the causes of oscillator noise. This system can measure modulation at less than -50dbc and accurately predict the oscillator noise spectrum.
Keywords
Amplitude modulation; Circuit noise; Detectors; Frequency; Measurement techniques; Noise level; Noise measurement; Oscillators; Phase modulation; Phase noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132446
Filename
1132446
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