• DocumentCode
    386055
  • Title

    A New Automated Noise and Gain Parameter Measurement System

  • Author

    Hirsch, V.A. ; Miers, T.H.

  • Volume
    1
  • fYear
    1987
  • fDate
    May 9 1975-June 11 1987
  • Firstpage
    517
  • Lastpage
    520
  • Abstract
    This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz. A new test set configuration and thorough measurement techniques are employed to minimize errors. The noise and gain parameters for an 0.3 µm gate GaAs FET at 10 and 22 GHz are presented.
  • Keywords
    Acoustic reflection; Admittance; Colored noise; FETs; Gain measurement; Gallium arsenide; Noise figure; Noise measurement; System testing; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1987 IEEE MTT-S International
  • Conference_Location
    Palo Alto, CA, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1987.1132448
  • Filename
    1132448
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=386055