Title :
Femtosecond laser-assisted microstructuring of silicon for novel detector, sensing and display technologies
Author :
Carey, James E. ; Mazur, Eric
Author_Institution :
Dept. of Eng. & Appl. Phys., Harvard Univ., Cambridge, MA, USA
Abstract :
Summary form only given. Arrays of sharp, conical microstructures are obtained by texturing the surface of a silicon wafer using femtosecond laser-assisted chemical etching. The one step, maskless texturing process drastically changes the optical, material and electronic properties of the original silicon wafer. These properties make microstructured silicon viable for use in a wide range of commercial devices including solar cells, infrared photodetectors, chemical and biological sensors, and field emission devices. We describe the unique optical and electronic properties of microstructured silicon, discuss the formation process of the conical microstructures, and review the chemical and structural make-up of the surface that are responsible for the novel optoelectronic properties. We also deal with future directions for this technique including structuring of new materials, incorporation of new ambient gases, and better control over the position and density of the microstructures themselves.
Keywords :
avalanche photodiodes; chemical sensors; elemental semiconductors; field emission displays; infrared detectors; laser beam etching; silicon; surface morphology; surface texture; Si; Si(111) surface; below-band-gap photocurrent generation; biological sensors; chemical sensors; detector technologies; display technologies; femtosecond laser-assisted chemical etching; femtosecond laser-assisted microstructuring; field emission devices; infrared photodetectors; sensing technologies; sharp conical microstructure arrays; solar cells; surface morphology; surface texturing; textured avalanche photodiodes; Biomedical optical imaging; Chemical lasers; Displays; Microstructure; Optical materials; Optical sensors; Silicon; Stimulated emission; Ultrafast electronics; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7500-9
DOI :
10.1109/LEOS.2002.1133936