DocumentCode
3861216
Title
Technical theme topics [Introduction]
Author
Christos Christopoulos
Volume
4
Issue
4
fYear
2015
Firstpage
79
Lastpage
79
Abstract
Ultimately, the victims of EMI are integrated circuits used in the construction of electronic controllers, memories etc. An understanding of how such components are designed and respond to EMI can bring significant benefits to designers and users who aim to achieve EMC. The current theme is thus EMC and 3D-ICs where we explore the issues arising from the integration of ICs into three-dimensional structures and the EMC problems arising from such developments. The joint paper by Sicard et al brings together some of the leading experts in the world to present a comprehensive and up-to-date review of the issues involved. In this issue, Part I of the paper is presented covering the more general aspects of the topic.
Keywords
"Electromagnetic compatibility","Electromagnetic interference","Integrated circuit interconnections","Measurement techniques"
Journal_Title
IEEE Electromagnetic Compatibility Magazine
Publisher
ieee
ISSN
2162-2264
Type
jour
DOI
10.1109/MEMC.2015.7407185
Filename
7407185
Link To Document