Title :
19 GHz vertical Si p-channel MOSFET
Author :
J. Moers;D. Klaes;A. Tonnesmann;L. Vescan;S. Wickenhauser;M. Marso;P. Kordos;H. Luth
Author_Institution :
Inst. fur Schicht- und Ionentech., Forschungszentrum Julich GmbH, Germany
Abstract :
Vertical Si p-MOSFETs with channel lengths of 100 nm were fabricated using selective low pressure chemical vapour deposition (LPCVD) epitaxial growth and conventional i-line lithography. The layout, called VOXFET, reduces gate to source/drain overlap capacitances, thus improving high speed applications. Transistors with a gate width of 12 /spl mu/m and gate oxide thickness of 10 nm show transconductances g/sub m/ of 200 mS/mm and measured cutoff frequencies of f/sub T/=8.7 GHz and f/sub MAX/=19.2 GHz.
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990138