Title :
Switch element reliability required to maintain large-scale photonic cross-connect switch reliability
Author :
Noguchi, Kazuhiro ; Koga, Masafumi
Author_Institution :
NTT Network Innovation Labs., NTT Corp., Kanagawa, Japan
Abstract :
This paper discusses how switch element reliability affects the reliability of large-scale switches. We evaluated the relation between switch element FIT and large-scale OXC reliability. In so doing, we found that the DC-SW is the most reliable type of optical switch because it can be composed of fewer switch elements.
Keywords :
failure analysis; micro-optics; microswitches; optical switches; photonic switching systems; telecommunication network reliability; 3D-MEMS switches; DC-SW optical switch; PXC survival probability; delivery-and-coupling switch; initial mirror element defect; large-scale OXC reliability; large-scale photonic cross-connect switch reliability; switch element FIT; switch element reliability; Electric breakdown; Electronic mail; Laboratories; Large-scale systems; Maintenance; Micromechanical devices; Mirrors; Switches; Technological innovation; Yield estimation;
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7500-9
DOI :
10.1109/LEOS.2002.1134017
