DocumentCode
386173
Title
Switch element reliability required to maintain large-scale photonic cross-connect switch reliability
Author
Noguchi, Kazuhiro ; Koga, Masafumi
Author_Institution
NTT Network Innovation Labs., NTT Corp., Kanagawa, Japan
Volume
1
fYear
2002
fDate
2002
Firstpage
241
Abstract
This paper discusses how switch element reliability affects the reliability of large-scale switches. We evaluated the relation between switch element FIT and large-scale OXC reliability. In so doing, we found that the DC-SW is the most reliable type of optical switch because it can be composed of fewer switch elements.
Keywords
failure analysis; micro-optics; microswitches; optical switches; photonic switching systems; telecommunication network reliability; 3D-MEMS switches; DC-SW optical switch; PXC survival probability; delivery-and-coupling switch; initial mirror element defect; large-scale OXC reliability; large-scale photonic cross-connect switch reliability; switch element FIT; switch element reliability; Electric breakdown; Electronic mail; Laboratories; Large-scale systems; Maintenance; Micromechanical devices; Mirrors; Switches; Technological innovation; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7500-9
Type
conf
DOI
10.1109/LEOS.2002.1134017
Filename
1134017
Link To Document