DocumentCode :
386216
Title :
THz technology for label-free genetic diagnostics
Author :
Nagel, M. ; Richter, F. ; Brucherseifer, M. ; Bolivar, P. Haring ; Kurz, H. ; Bosserhoff, A. ; Buttner, R.
Author_Institution :
Inst. fur Halbeitertech. II, Rheinisch-Westfalische Tech. Hochschule, Aachen, Germany
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
345
Abstract :
THz-wave based approaches for the label-free characterization of genetic material are presented. Time-resolved THz spectroscopic analysis of genetic sequences (polynucleotides) demonstrate a clearly distinct complex refractive index in the THz frequency range as a function of the hybridization state (hybridized/denatured) of the analysed DNA sequences. By monitoring THz signals one can thus infer the binding state of oligo- and polynucleotides, enabling the label-free determination of the genetic composition of polynucleotides. A broadband experimental proof-of-principle in a free-space configuration, as well as a first demonstration of a high-sensitivity integrated approach reaching femtomol detection levels and single base mutation detection capabilities, are presented.
Keywords :
DNA; biological techniques; genetics; microwave spectra; molecular biophysics; refractive index; time resolved spectra; analysed DNA sequences; broadband experimental proof-of-principle; complex refractive index; femtomol detection levels; free-space configuration; genetic composition; genetic material; genetic sequences; high-sensitivity integrated approach; hybridization state; label-free characterization; label-free determination; label-free genetic diagnostics; oligonucleotides; polynucleotides; single base mutation detection capabilities; terahertz frequency range; terahertz signals; terahertz-wave based approaches; time-resolved terahertz spectroscopic analysis; DNA; Fluorescence; Frequency; Genetic mutations; Labeling; Medical diagnostic imaging; Monitoring; Probes; Refractive index; Sequences;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE
ISSN :
1092-8081
Print_ISBN :
0-7803-7500-9
Type :
conf
DOI :
10.1109/LEOS.2002.1134071
Filename :
1134071
Link To Document :
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