Fast ADC Testing by Repetitive Histogram Analysis

Modeling the integral nonlinearity by the unified behavioral error model which is expressed as one dimensional image in the code k domain requires a minimal number of error parameters. The unified error model consists of low and high code frequency components. The paper presents new methods for low code frequency and high code frequency testing. The identification of low code and high code frequency components is based on a stochastic analysis of both components by using harmonic signals with reduced amplitude. The high code frequency component for code bins with extraordinary high nonlinearities is estimated in the statistical domain by a narrow band histogram using sinusoidal stimulus. The uncertainty of the proposed method is being assessed in the paper for various ADC representatives