DocumentCode :
3862713
Title :
Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters
Author :
Yuxi Wang; Zhan Li; Hao Ma
Author_Institution :
College of Electrical Engineering, Zhejiang University, Hangzhou, China, 310027
fYear :
2015
fDate :
6/15/2016 12:00:00 AM
Firstpage :
257
Lastpage :
262
Abstract :
This paper investigates two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters. One is based on bridge arm pole voltage, and the other is based on bridge arm line voltage. With extra simple circuit, these two diagnosis methods can detect and identify single and multiple open-circuit faults of the inverter IGBTs effectively. The comparison of diagnosis time and anti-interference feature between these two methods has been presented. The simulation results are carried out to show the effectiveness and differences of these two methods.
Keywords :
"Circuit faults","Bridge circuits","Insulated gate bipolar transistors","Inverters","Switches","Simulation","Fault diagnosis"
Publisher :
ieee
Conference_Titel :
Industrial Electronics (ISIE), 2015 IEEE 24th International Symposium on
Electronic_ISBN :
2163-5145
Type :
conf
DOI :
10.1109/ISIE.2015.7281478
Filename :
7281478
Link To Document :
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