• DocumentCode
    3862713
  • Title

    Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters

  • Author

    Yuxi Wang; Zhan Li; Hao Ma

  • Author_Institution
    College of Electrical Engineering, Zhejiang University, Hangzhou, China, 310027
  • fYear
    2015
  • fDate
    6/15/2016 12:00:00 AM
  • Firstpage
    257
  • Lastpage
    262
  • Abstract
    This paper investigates two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters. One is based on bridge arm pole voltage, and the other is based on bridge arm line voltage. With extra simple circuit, these two diagnosis methods can detect and identify single and multiple open-circuit faults of the inverter IGBTs effectively. The comparison of diagnosis time and anti-interference feature between these two methods has been presented. The simulation results are carried out to show the effectiveness and differences of these two methods.
  • Keywords
    "Circuit faults","Bridge circuits","Insulated gate bipolar transistors","Inverters","Switches","Simulation","Fault diagnosis"
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2015 IEEE 24th International Symposium on
  • Electronic_ISBN
    2163-5145
  • Type

    conf

  • DOI
    10.1109/ISIE.2015.7281478
  • Filename
    7281478