Title :
Subsurface nanoimaging by THz pulse near-field microscopy
Author :
Kiwon Moon;Hongkyu Park;Jeonghoi Kim;Youngwoong Do;Soonsung Lee;Gyuseok Lee;Hyeona Kang;Jin-Woo Kim;Haewook Han
Author_Institution :
Department of Electrical and Computer Engineering, POSTECH, Pohang, Gyeongbuk 790-784, Korea
Abstract :
Combined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging with a nearly frequency-independent lateral resolution of 90 nm, corresponding to -X/3300 at 1 THz.
Keywords :
"Microscopy","Image resolution","Optical imaging","Optical microscopy","Optical scattering","Optical pulses"
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
Electronic_ISBN :
2162-2035
DOI :
10.1109/IRMMW-THz.2015.7327871