DocumentCode
3862943
Title
Subsurface nanoimaging by THz pulse near-field microscopy
Author
Kiwon Moon;Hongkyu Park;Jeonghoi Kim;Youngwoong Do;Soonsung Lee;Gyuseok Lee;Hyeona Kang;Jin-Woo Kim;Haewook Han
Author_Institution
Department of Electrical and Computer Engineering, POSTECH, Pohang, Gyeongbuk 790-784, Korea
fYear
2015
Firstpage
1
Lastpage
3
Abstract
Combined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging with a nearly frequency-independent lateral resolution of 90 nm, corresponding to -X/3300 at 1 THz.
Keywords
"Microscopy","Image resolution","Optical imaging","Optical microscopy","Optical scattering","Optical pulses"
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
ISSN
2162-2027
Electronic_ISBN
2162-2035
Type
conf
DOI
10.1109/IRMMW-THz.2015.7327871
Filename
7327871
Link To Document