Title :
Test bench for investigation of awkward shaped signals influence on radioelectronic equipment
Author :
Bolotov, V.N. ; Tkach, Yu.V.
Author_Institution :
Inst. for Electromagn. Res., Kharkov, Ukraine
Abstract :
Studies of electronic equipment resistance to external electromagnetic interference has become an urgent problem due to many reasons. One of the most important reasons is the permanently complicated electromagnetic compatibility, caused by the increasing number of receiver-transmitter devices operating in the microwave band. To study the formation of chaotic states in electronic equipment, when affected by a complex sequence of short microwave pulses with variable pulse-to-pulse length, a specialized stand was developed.
Keywords :
chaos generators; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; microwave generation; microwave measurement; test equipment; 2 to 8.8 GHz; EMC; circuit stability; electromagnetic compatibility; electromagnetic interference; electronic equipment EMI resistance; electronic equipment chaotic states; microwave band receiver-transmitter devices; radioelectronic equipment awkward shaped signal influence; variable pulse-to-pulse length microwave pulses; Broadband antennas; Dipole antennas; Directive antennas; Pulse generation; Pulse modulation; Radiation detectors; Receiving antennas; Signal generators; Signal processing; Testing;
Conference_Titel :
Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference
Print_ISBN :
966-7968-12-X
DOI :
10.1109/CRMICO.2002.1137330