DocumentCode :
386668
Title :
A 4 Gsamples/s with 2-4 GHz input bandwidth SiGe digitizer for radio astronomy applications
Author :
Deschans, D. ; Begueret, J-B ; Deval, Y. ; Scarabello, C. ; Fouillat, P. ; Montignac, G. ; Baudry, A.
Author_Institution :
IXL Lab., Bordeaux I Univ., Talence, France
fYear :
2002
fDate :
2002
Firstpage :
350
Lastpage :
355
Abstract :
This paper presents the design details and the measurement results of a high speed A/D converter (ADC or digitizer) developed specifically for radioastronomy applications. This monolithic digitizer is implemented in a SiGe BiCMOS process for high frequency mixed-signal applications. The principal characteristics of this circuit are a 2 bits resolution with 3 quantization levels (or 1.5 bits), a wide input bandwidth front end, 2 GHz up to 4 GHz, and a sampling rate of 4 Gsamples/s (Gsps). The architecture for the design of this digitizer is that of a conventional flash analog to digital structure. The experimental results obtained with our sampler ASIC show sinusoidal input signals are properly sampled for clock rates up to 5 GHz. The overall chip dissipates 975 mW under ±1.25 V supply and the die area is 652 mm2.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; analogue-digital conversion; integrated circuit design; integrated circuit measurement; low-power electronics; mixed analogue-digital integrated circuits; radioastronomy; semiconductor materials; -1.25 to 1.25 V; 2 bit; 2 to 4 GHz; 5 GHz; 975 mW; ADC input bandwidth; ADC sampling rate; ASIC; SiGe; chip die area; chip power dissipation; chip supply voltage; circuit quantization levels; circuit resolution; flash analog to digital structure; high frequency mixed-signal applications; high speed A/D converters; monolithic SiGe BiCMOS digitizers; radio astronomy applications; sinusoidal input signal sampling clock rate; Bandwidth; BiCMOS integrated circuits; Extraterrestrial measurements; Frequency; Germanium silicon alloys; Quantization; Radio astronomy; Signal sampling; Silicon germanium; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits and Systems Design, 2002. Proceedings. 15th Symposium on
Print_ISBN :
0-7695-1807-9
Type :
conf
DOI :
10.1109/SBCCI.2002.1137682
Filename :
1137682
Link To Document :
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