Microwave dielectric properties of solids for applications at temperatures to 3000 ° F

Measurement of dielectric constant and loss of materials at 3000 mc/sec with apparatus capable of yielding nearly uniform accuracy over the range from room temperature to 3000° F is described. Results of these measurements on high-alumina materials show the practical temperature limits of operation of these materials as dielectrics at the frequency employed. Results on laminates of thermosetting plastic resins indicate temperature limits above which irreversible changes in dielectric properties occur.