DocumentCode :
387045
Title :
An improved monolithic instrumentation amplifier
Author :
Timko, M. ; Brokaw, A.
Author_Institution :
Analog Devices/Semiconductor, Wilmington, MA, USA
Volume :
XVIII
fYear :
1975
fDate :
27426
Firstpage :
196
Lastpage :
197
Abstract :
A thin-film/bipolar monolithic instrumentation amplifier configured to allow straightforward internal frequency compensation, will be described. Features include input overload protection, low drift, provision for over compensation and 40-MHz gain-bandwidth.
Keywords :
Analog integrated circuits; Bandwidth; Differential amplifiers; Fabrication; Instruments; Monolithic integrated circuits; Protection; Roentgenium; Semiconductor optical amplifiers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1975 IEEE International
Type :
conf
DOI :
10.1109/ISSCC.1975.1155449
Filename :
1155449
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=387045
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