• DocumentCode
    387051
  • Title

    Solid-state microwave electronics

  • Volume
    II
  • fYear
    1959
  • fDate
    12-13 Feb. 1959
  • Firstpage
    46
  • Lastpage
    46
  • Keywords
    Microwave devices; Semiconductor device reliability; Semiconductor devices; Solid state circuits; Stability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1959 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1959.1157058
  • Filename
    1157058